Automation of Electrical Stress Testing for Electronic Components Using Labview Software Environment

Keywords:
Electrical Stress, LabVIEW, Proximity Sensor, Testing

Abstract:
This document describes the implementation of the LabVIEW software platform in automating the reliability testing of electronic components subjected to critical electrical disturbances in certain military products. Most of the products used in military technologies have very sensitive electronic parts which must be tested in various operational conditions. In this paper, tests related to the electronics in a product called the Proximity sensor vPS-M23 will be checked under many conditions required by relevant standardizations. The applicable testing procedures have been performed in order to ascertain any unexpected reactions of the electronics used in the proximity sensor when exposed to various credible or other stressing electrical stimuli and to determine the level of electrical ruggedness of the safety system. The core contribution of this work is in generating the results and determining pass or fall criteria related to the tests, such as measuring voltage rise and fall as well as short - term power drop-outs. By using DAQmx drivers and specific algorithms for precise time - sequence management, an automated system for testing' performance was developed in order to ensure high test repeatability and minimize human error compared to the manual methods. The results demonstrate that the LabVIEW implementation significantly accelerates the component characterization process, providing precise insights into the dynamic response of systems under stress, which is crucial for quality assurance in modern military electronic components and also eliminates human error during testing of the products.

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S. Pelemiš, N. Latinović, M. Veinović, “Automation of Electrical Stress Testing for Electronic Components Using Labview Software Environment,” in Sinteza 2026 - International Scientific Conference on Information Technology, Computer Science, and Data Science, Belgrade, Singidunum University, Serbia, 2026, pp. 294-300. doi:10.15308/Sinteza-2026-294-300

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Pelemiš, S., Latinović, N., Veinović, M. (2026). Automation of Electrical Stress Testing for Electronic Components Using Labview Software Environment. Paper presented at Sinteza 2026 - International Scientific Conference on Information Technology, Computer Science, and Data Science. doi:10.15308/Sinteza-2026-294-300

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